Bruker FastScan (AFM)

The high-speed atomic force microscope delivers precise, high-resolution surface imaging at the nanoscale. Ideal for det...

Bruker Dektak XT (surface profilometer)

is a fast solution for surface profiling and thickness measurements. It offers high-resolution, accurate data with a use...

FEI NovaNanoSEM (Specimen surface inspection)

is a cutting-edge scanning electron microscope designed for high-resolution imaging and analysis of nanostructures. With...

Renishaw Invia Reflex (Raman spectroscopy)

is a sophisticated analytical tool used for high-resolution chemical and structural analysis. It utilizes Raman spectros...

Woollam M-2000 (ellipsometer)

It provides detailed measurements of film thickness, refractive index, and optical properties of the materials and compl...

FEI FIBSEM Helios G4 CX (SEM and FIB)

The tool offers high-resolution imaging and precise material removal for detailed sample preparation and analysis. Imagi...